Mass Dependent Loss of Resolution in Radially Inhomogeneous ExB Ion Traps

Authors

Mark A. Capron, University of Northern Iowa
Susan S. Haskin, University of Northern Iowa
Curtiss D. Hanson, University of Northern IowaFollow

Document Type

Research

Keywords

Ion cyclotron resonance, mass spectrometry, ion motion, loss of resolution

Abstract

ExB ion traps, such as Fourier transform Ion Cyclotron Resonance mass spectrometers (FY:ICR), mass analyze sample ions based on differences in their cyclotron frequencies in a homogeneous magnetic field. The high resolution mass measurements of FT-ICR are based on the relationship between the frequency of the cyclotron orbit and the mass-to-charge (m/q) ratio of an ion. Both the orbit and the frequency/mass relationship result from the radial forces on the ion. Ions trapped by inhomogeneous electric fields experience different magnitudes of the radial electric fields at different positions resulting in a positionally dependent frequency. Such differences in orbital frequencies for ions of a single m/q ratio result in line broadening and loss of resolution.

Publication Date

March 1992

Journal Title

Journal of the Iowa Academy of Science

Volume

99

Issue

1

First Page

1

Last Page

6

Copyright

© Copyright 1992 by the Iowa Academy of Science, Inc.

Language

EN

File Format

application/pdf

Recommended Citation

Capron, Mark A.; Haskin, Susan S.; and Hanson, Curtiss D. (1992) "Mass Dependent Loss of Resolution in Radially Inhomogeneous ExB Ion Traps," Journal of the Iowa Academy of Science: JIAS, 99(1), 1-6.
Available at: https://scholarworks.uni.edu/jias/vol99/iss1/3