Faculty Publications

Structural Determination of the C60/Ge(111) Interface via X-ray Diffraction

Document Type

Article

Keywords

Carbon, Coatings, Germanium, Single crystal epitaxy, Surface relaxation and reconstruction, X-ray scattering, diffraction, and reflection

Journal/Book/Conference Title

Surface Science

Volume

397

Issue

1-3

First Page

185

Last Page

190

Abstract

An X-ray diffraction study was performed to determine the nature of the C60/Ge(111) interface formed by depositing C60 on a Ge(111)-c(2 × 8) surface at room temperature. In-plane k-scans show a (1 × 1) periodicity at the C60/Ge(111) interface with no trace of the c(2 × 8) reconstruction, indicating that the Ge adatoms on the clean c(2 × 8)-reconstructed surface are displaced. Scans along the (10) rod indicate that these adatoms are transferred from the T4 bonding site to the H3 site after C60 deposition. A model consisting of three relaxed bilayers of Ge and randomly distributed adatoms in the H3 site explains our results. © 1998 Elsevier Science B.V.

Department

Department of Physics

Original Publication Date

1-1-1998

DOI of published version

10.1016/S0039-6028(97)00731-0

Link to Full Text

Comments?

Share

COinS