Faculty Publications
Ostwald Ripening of Manganese Silicide Islands on Si(001)
Document Type
Article
Journal/Book/Conference Title
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume
24
Issue
4
First Page
1480
Last Page
1483
Abstract
The deposition of Mn onto Si(001) in the submonolayer regime has been studied with scanning tunneling microscopy to gain insight into the bonding and energetics of Mn with Si. The as-deposited Mn films at room temperature are unstructured. Upon annealing to 300-700 °C three-dimensional islands of Mn or Mnx Siy form while between the islands the Si(001)- (2×1) reconstruction becomes visible. With increasing annealing time the density of islands per surface area decreases while the average height of the remaining islands increases. The large islands grow in size at the expense of the small ones, which can be understood in the context of Ostwald [Z. Phys. Chem. 34, 495 (1900)] ripening theory. The average island height shows a time dependence of H∼ t14, indicating that surface diffusion is the growth limiting process. © 2006 American Vacuum Society.
Department
Department of Physics
Original Publication Date
7-1-2006
DOI of published version
10.1116/1.2167070
Recommended Citation
Stollenwerk, Andrew; Krause, M. R.; Licurse, M.; and LaBella, V. P., "Ostwald Ripening of Manganese Silicide Islands on Si(001)" (2006). Faculty Publications. 6062.
https://scholarworks.uni.edu/facpub/6062