Home > Iowa Academy of Science > Journals & Newsletters > Proceedings of the Iowa Academy of Science > Volume 41 (1934) > Annual Issue
Document Type
Research
Abstract
Using a Siegbahn vacuum spectrometer and thin films of bismuth produced by sputtering, the wavelengths of the five x-ray M-absorption edges of bismuth 83 have been measured. For the edges M1 and M2, which had not previously been measured, the discrepancy between the computed and observed values is of the order of magnitude of experimental error while the usual large M4 and M5 discrepancies, first observed in this laboratory on other elements, are verified for bismuth. An interpretation of the large discrepancies between the experimental and computed wavelengths of the edges M4 and M5 based on experiments in other fields on the one hand and Block's and Kronig's wave-mechanical theory of energy levels in a crystal on the other is suggested. It is concluded that the M1 , M2 , and M3 electron in an absorption act go to the top of the filled free-electron levels while the M4 and M5 electrons go on out to higher energy levels of the crystal lattice.
Publication Date
1934
Journal Title
Proceedings of the Iowa Academy of Science
Volume
41
Issue
1
First Page
249
Last Page
249
Copyright
©1934 Iowa Academy of Science, Inc.
Language
en
File Format
application/pdf
Recommended Citation
Phelps, W. D.
(1934)
"The M-Series Absorption Spectrum of Metallic Bismuth,"
Proceedings of the Iowa Academy of Science, 41(1), 249-249.
Available at:
https://scholarworks.uni.edu/pias/vol41/iss1/77