•  
  •  
 

Document Type

Research

Abstract

Previous investigators have found the specific resistance a constant for metallic films, until the thickness becomes comparable with particle dimensions, at which thickness the resistance becomes very great. Wait found the resistivity of chemically deposited silver films, whose thicknesses were greater than the above mentioned critical thickness, to be only slightly greater than that of the bulk metal. He found the Hall Effect in these films, as well as in films whose thicknesses were less than the critical thickness, to be the same as that of bulk silver. On the conception that the substance in a film consists of granules not in the intimate contact obtaining in the bulk form, these results could be accounted for. Consequently it became desirable to investigate silver films obtained by an evaporation method, in order to ascertain how they differ from chemically deposited films, and how these differences affect their properties.

Publication Date

1922

Journal Title

Proceedings of the Iowa Academy of Science

Volume

29

Issue

1

First Page

153

Last Page

154

Copyright

©1922 Iowa Academy of Science, Inc.

Language

en

File Format

application/pdf

Share

COinS
 
 

To view the content in your browser, please download Adobe Reader or, alternately,
you may Download the file to your hard drive.

NOTE: The latest versions of Adobe Reader do not support viewing PDF files within Firefox on Mac OS and if you are using a modern (Intel) Mac, there is no official plugin for viewing PDF files within the browser window.