Faculty Publications

Ballistic Electron Microscopy and Spectroscopy of Metal and Semiconductor Nanostructures

Document Type

Article

Keywords

Ballistic transport, Electroluminescence, Organic materials, Semiconductor heterostructures, Spintronics, Tunneling microscopy

Journal/Book/Conference Title

Surface Science Reports

Volume

64

Issue

5

First Page

169

Last Page

190

Abstract

Ballistic electron emission microscopy (BEEM) and its spectroscopy utilize ballistic transport of hot carriers as a versatile tool to characterize nanometer-scale structural and electronic properties of metallic and semiconducting materials and their interfaces. In this review, recent progress in experimental and theoretical aspects of the BEEM technique are covered. Emphasis is drawn to the development of BEEM in several emerging fields, including spin-sensitive hot-carrier transport through ferromagnetic thin films and multilayers, hot-electron spectroscopy and imaging of organic thin films and molecules, and hot-electron induced electroluminescence in semiconductor heterostructures. A brief discussion on BEEM of cross-sectional semiconductor heterostructures and advanced insulator films is also included. © 2009 Elsevier B.V. All rights reserved.

Department

Department of Physics

Original Publication Date

5-1-2009

DOI of published version

10.1016/j.surfrep.2009.01.001

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