Honors Program Theses
Award/Availability
Open Access Honors Program Thesis
First Advisor
T. E. Kidd
Keywords
Thin films--Electric properties; Nanostructured materials;
Abstract
Thin manganese films were grown by thermal evaporation in high vacuum. The growth rate was varied to determine how the growth rate affects the continuity of ultra-thin films. The resistance was measured with the two-point method in situ and the data was recorded digitally. The resistance was converted to resistivity and this was plotted against thickness. It was found that resistivity decreases exponentially as the film begins to form in islands. The film reaches a critical thickness as the islands coalesce and the data can then be fitted with Fuchs’ equation. The resistivity continues to decrease but the minimum resistivity of the film does not reach bulk resistivity because there are inherent defects in the film.
Year of Submission
2011
Department
Department of Physics
University Honors Designation
A thesis submitted in partial fulfillment of the requirements for the designation University Honors
Date Original
2011
Object Description
22 p. : ill.
Copyright
© 2011 Erik Thomas Wolter
Language
EN
File Format
application/pdf
Recommended Citation
Wolter, Erik Thomas, "Growth and characterization of nanoscale thin films" (2011). Honors Program Theses. 36.
https://scholarworks.uni.edu/hpt/36
