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Document Type

Research

Keywords

Ion cyclotron resonance, mass spectrometry, ion motion, loss of resolution

Abstract

ExB ion traps, such as Fourier transform Ion Cyclotron Resonance mass spectrometers (FY:ICR), mass analyze sample ions based on differences in their cyclotron frequencies in a homogeneous magnetic field. The high resolution mass measurements of FT-ICR are based on the relationship between the frequency of the cyclotron orbit and the mass-to-charge (m/q) ratio of an ion. Both the orbit and the frequency/mass relationship result from the radial forces on the ion. Ions trapped by inhomogeneous electric fields experience different magnitudes of the radial electric fields at different positions resulting in a positionally dependent frequency. Such differences in orbital frequencies for ions of a single m/q ratio result in line broadening and loss of resolution.

Publication Date

March 1992

Journal Title

Journal of the Iowa Academy of Science

Volume

99

Issue

1

First Page

1

Last Page

6

Copyright

© Copyright 1992 by the Iowa Academy of Science, Inc.

Language

EN

File Format

application/pdf