Award/Availability

Open Access Honors Program Thesis

First Advisor

T. E. Kidd

Keywords

Thin films--Electric properties; Nanostructured materials;

Abstract

Thin manganese films were grown by thermal evaporation in high vacuum. The growth rate was varied to determine how the growth rate affects the continuity of ultra-thin films. The resistance was measured with the two-point method in situ and the data was recorded digitally. The resistance was converted to resistivity and this was plotted against thickness. It was found that resistivity decreases exponentially as the film begins to form in islands. The film reaches a critical thickness as the islands coalesce and the data can then be fitted with Fuchs’ equation. The resistivity continues to decrease but the minimum resistivity of the film does not reach bulk resistivity because there are inherent defects in the film.

Date of Award

2011

Department

Department of Physics

University Honors Designation

A thesis submitted in partial fulfillment of the requirements for the designation University Honors

Date Original

2011

Object Description

22 p. : ill.

Language

EN

File Format

application/pdf

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